Comparison of AC electronic monitoring and field data for estimating tolerance to Empoasca kraemeri (Homoptera : Cicadellidae) in common bean genotypes

• Author(s): Backus, Elaine; Cardona, C.; Serrano, M.;
• Abstract: Two methods for estimating the tolerance of common beau genotypes to Empoasca kraemeri Ross & Moore were compared, using a yield trial carried out at Centro Internacional de Agricultura Tropical (CIAT), Call, Colombia versus stylet penetration tactics measured by AC electronic feeding monitors. A stylet penetration index was devised based on principal component scores of three penetration tactics identified (pulsing laceration, cell rupturing and lancing sap ingestion), combined with knowledge of the hopperburn symptoms caused by each tactic. Tolerant genotypes, as classified by the CIAT yield index, showed significantly more unprotected yield and lower hopperburn scores than the susceptible control. They also induced performance of less pulsing laceration (the tactic considered most damaging to the plant), lund more of the other two, mitigating tactics, especially cell rupturing. When index: values were calculated for each genotype, stylet penetration index values matched those of the yield index for three out of five genotypes: two EMP-coded tolerant lines (EMP 385 and EMP 392) and die susceptible control BAT 41. Thus, for these three genotypes, all subsequent hopperburn symptoms are predictable by the type of feeding behavior performed on them. Porrillo Sintetico and EMP 84, considered borderline genotypes by the yield index, were overestimated and underestimated, respectively, by the stylet penetration index. We postulate that, for these two genotypes, plant physiological responses to feeding (either compensatory or heightened sensitivity respectively) synergize with type of feeding performed to generate the overall hopperburn condition. This multivariate analysis of electronic monitoring data was Successfully used to devise an index of resistance. The implications of using the stylet penetration index and the advantages of using electronic monitoring in a bean-breeding program are discussed.
• Publication Date: Dec 2000
• Journal: Journal Of Economic Entomology